DATA-DRIVEN cyber risk management

Training catalog

Cyber risk quantification training built on the FAIR™ Standard. Instructor-led and self-paced programs for executives, managers, and practitioners.

E-LEARNING

ED-EL-05

Building a Data-Driven TPRM Program with FAIR

  • ≈ 10 h
  • 10 CPE

A scenario-based program for managing cyber and operational risks across third-party relationships using the FAIR™ Standard.

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ILT

ED-IN-02

Data-Driven Cyber Risk Management with FAIR for Practitioners

  • 2 days · 12 h
  • 12 CPE

A two-day hands-on practitioner program covering the FAIR™ taxonomy and analysis process — preparation for the OpenFAIR™ 2 Foundation exam.

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E-LEARNING

ED-EL-02

Data-Driven Cyber Risk Management with FAIR for Practitioners

  • ≈ 12 h
  • 12 CPE

The full FAIR™ practitioner program, self-paced — with an OpenFAIR™ 2 mock exam and Monte Carlo simulation walkthroughs.

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ILT

ED-IN-01

Introduction to Data-Driven Cyber Risk Management with FAIR

  • 3 h
  • 3 CPE

A 3-hour introduction to the FAIR™ Standard for managers and support-function leaders working alongside cyber risk practitioners.

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E-LEARNING

ED-EL-01

Introduction to Data-Driven Cyber Risk Management with FAIR

  • ≈ 3 h
  • 3 CPE

A self-paced foundation in cyber risk quantification with the FAIR™ Standard — videos, interactive materials, and practical examples.

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ILT

ED-IN-03

Maximizing Opportunities through Data-Driven Decision Making for Executives

  • 1 h
  • 1 CPE

A focused one-hour briefing for executives — data-driven cyber and technology risk governance aligned with ISO 31000, COSO ERM, NIS2, and DORA.

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ILT

ED-IN-04

Turning Controls into Measurable Risk Reduction with FAIR-CAM

  • 4 h
  • 4 CPE

An advanced workshop on modeling cybersecurity control effectiveness with FAIR-CAM™ — turn controls into measurable risk reduction.

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E-LEARNING

ED-EL-04

Turning Controls into Measurable Risk Reduction with FAIR-CAM

  • ≈ 10 h
  • 10 CPE

Self-paced FAIR-CAM™ training — designed in collaboration with Jack Jones, creator of FAIR.

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